- · A mass spectrometer technology that uses the Laser Desorption/Ionization – Time of Flight (LDI-TOF) technology to analyze OLED panels, materials, and devices.
- · Mass distribution spectrum analysis based on the mobility of ion particles generated by ionization of OLED samples by laser in a vacuum tube.
- · Measurement and analysis using ultra-fine laser and high-precision stage of mass imaging data indicating spatial mass distribution.
- · Prep station and holder/plate for measurement of OLED samples in various heights.
- · Installed even in small areas, low consumables cost, and relatively quick measurement compared to other analytical methods.
LDI-TOF



Application

Polymer Analysis

Organic Material Analysis
[OLED Materials] Component Analysis and Quality Control of Display Materials

Mass image per pixel

OLED analysis paper using LDI-TOF (SID publications by international information display societies)
LDI-TOF (Laser Desorption Ionization Time of Flight) is a mass spectrometry instrument used for OLED analysis and inspection, capable of direct analysis of OLED panels at the pixel level.
LDI-TOF has a built-in ultra-fine laser optical system, developed in-house, that can analyze spot sizes of less than 5㎛ and developed the world’s only equipment operating software based on the latest web technology (node.js) for convenience scalability.
ASTA succeeded in developing the world’s first next-generation LDI-TOP-based OLED analytical system.
Laser | Nd:YLF UV laser (349nm), 1G shots, 5,000hours |
---|---|
Vacuum System | High Vacuum System |
LxWxH | 580x1023x2144 mm |
Weight | 350 kg |
Option* | Bio Mass Imaging HR microscope |